Upright Material Microscope with Reflected & Transmitted Light, Brightfield, Halogen illumination
Upright Reflected and Transmitted-Light Materials Science Microscope
The RM-1-MET-T is a versatile upright materials science microscope combining reflected and transmitted illumination. It can examine opaque specimens using incident light and suitable transparent or translucent samples using transmitted light.
The reflected-light system incorporates field and aperture iris diaphragms for optimised illumination at different magnifications. The transmitted-light system includes a focusable Abbe condenser and field iris diaphragm for controlled specimen illumination.
Key features
- Upright materials science microscope
- Reflected and transmitted-light observation
- Binocular viewing head with photo tube
- Widefield 10× eyepieces with FN22 field of view
- One eyepiece fitted with a cross-line and scale graticule
- Quintuple objective nosepiece
- Mechanical stage
- Polariser and analyser
- Regulated illumination power supply
- 12 V, 50 W halogen incident illumination
- 6 V, 30 W halogen transmitted illumination
- Focusable Abbe condenser
- Condenser numerical aperture of 1.25
- Transmitted-light field iris diaphragm
Supplied objectives
| Objective | Numerical aperture | Working distance |
|---|---|---|
| Plan achromatic 5× | 0.10 | 17.50 mm |
| Plan achromatic 10× | 0.20 | 16.30 mm |
| Plan achromatic 20× | 0.40 | 8.35 mm |
| Plan achromatic 50× | 0.70 | 1.95 mm |
Total magnification
When used with the supplied 10× eyepieces:
- 50×
- 100×
- 200×
- 500×
Optional objectives
| Objective | Numerical aperture | Working distance |
|---|---|---|
| Plan achromatic 40× | 0.65 | 3.89 mm |
| Plan achromatic 80× | 0.89 | 0.84 mm |
| Plan achromatic 100× | 0.90 | 1.75 mm |
Optional accessories
- 0.5× C-mount camera adapter
- Reflecting stage micrometer with a 1 mm scale divided into 100 parts
- Compatible microscope camera systems
Typical applications
- Metallurgical inspection
- Materials science
- Examination of opaque, transparent and translucent samples
- Surface and coating inspection
- Materials identification
- Failure analysis
- Manufacturing quality control
- Engineering laboratories
- Research and education
Optional objectives, camera equipment and calibration accessories are available separately. Please contact Auckland Scientific for configuration and compatibility advice.