Wafer & PCB Inspection Microscope with Motorised Coded Nosepiece upto 12 Inch / 300mm wafers & Large Stage
Reflected illumination
£29,995.00
Sale price
£29,995.00
Regular price
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Wafer & PCB Inspection Microscope with Motorised Coded Nosepiece upto 12 Inch / 300mm wafers & Large Stage
£29,995.00
Sale price
£29,995.00
Regular price
Advanced Industrial Microscopy
Auckland Scientific AUC-420 Series
Industrial Wafer, Semiconductor & PCB Inspection Microscope
A professional trinocular inspection microscope designed for precise observation of wafers, large printed circuit boards, semiconductor components and other demanding industrial samples.
Three-Year Warranty
Supplied with an Auckland Scientific three-year warranty. Conditions apply, including annual preventative servicing by Auckland Scientific.
Professional Large-Sample Inspection
The Auckland Scientific AUC-420 Series combines an infinity-corrected optical system, long-working-distance Semi-APO and APO objectives, reflected brightfield and darkfield illumination, a motorised objective nosepiece and an oversized mechanical stage.
Its large 356 × 305mm stage is designed for the controlled movement and inspection of wafers up to 12 inches, large PCBs and other substantial industrial samples.
Two configurations are available. The AUC-420A is configured for reflected-light inspection of opaque samples, while the AUC-420B adds transmitted illumination for suitable transparent and semi-transparent samples.
Features & Benefits
Motorised objective selection
Front-mounted objective-switching buttons allow the operator to rotate the nosepiece in either direction without manually handling the objective turret.
Front-mounted objective-switching buttons allow the operator to rotate the nosepiece in either direction without manually handling the objective turret.
Coded sextuple nosepiece
The motorised and coded backward-facing sextuple nosepiece provides six objective positions and incorporates a slot for optional reflected-light DIC.
The motorised and coded backward-facing sextuple nosepiece provides six objective positions and incorporates a slot for optional reflected-light DIC.
Large-area sample handling
The 14 × 12-inch mechanical stage provides a 356 × 305mm movement range for wafers, large PCBs and industrial components.
The 14 × 12-inch mechanical stage provides a 356 × 305mm movement range for wafers, large PCBs and industrial components.
12-inch wafer capacity
A dedicated holder for wafers up to 12 inches is included with both configurations.
A dedicated holder for wafers up to 12 inches is included with both configurations.
Advanced industrial optics
Long-working-distance Semi-APO and APO objectives support high-resolution imaging across the supplied magnification range.
Long-working-distance Semi-APO and APO objectives support high-resolution imaging across the supplied magnification range.
Brightfield and darkfield
Reflected brightfield and darkfield modules are supplied as standard for routine observation and detailed surface-defect inspection.
Reflected brightfield and darkfield modules are supplied as standard for routine observation and detailed surface-defect inspection.
Ergonomic trinocular head
The adjustable 0–35° tilting head helps users maintain a comfortable viewing position during extended inspection sessions.
The adjustable 0–35° tilting head helps users maintain a comfortable viewing position during extended inspection sessions.
Low-position controls
Low-position focusing and stage controls minimise unnecessary hand movement during prolonged operation.
Low-position focusing and stage controls minimise unnecessary hand movement during prolonged operation.
Rapid sample positioning
The built-in stage clutch allows fast coarse positioning followed by precise movement using the fine stage-adjustment control.
The built-in stage clutch allows fast coarse positioning followed by precise movement using the fine stage-adjustment control.
Digital imaging ready
The trinocular light path can be directed between the eyepieces and an optional microscope camera for image capture, measurement and documentation.
The trinocular light path can be directed between the eyepieces and an optional microscope camera for image capture, measurement and documentation.
Convenient Front-Mounted Controls
Frequently used controls are positioned at the front of the microscope, close to the operator. This arrangement supports efficient operation while reducing unnecessary movement during extended inspection work.
- Forward and reverse objective-switching buttons
- Reflected and transmitted illumination selector
- Illumination brightness adjustment
- Low-position coarse and fine focusing controls
- Coarse-focus torque adjustment
- Focusing height stop
- Fine stage-adjustment control
Available Configurations
| Model | Illumination | Recommended applications |
|---|---|---|
| AUC-420A | Reflected light | Opaque wafers, PCB surfaces, semiconductor components, metals, precision moulds and engineered parts. |
| AUC-420B | Reflected and transmitted light | Opaque samples plus suitable transparent and semi-transparent samples, including certain optical components and flat-panel display samples. |
Which model should I choose?
Select the AUC-420A for reflected-light inspection of opaque samples. Choose the AUC-420B when both reflected and transmitted illumination are required.
Select the AUC-420A for reflected-light inspection of opaque samples. Choose the AUC-420B when both reflected and transmitted illumination are required.
High-Performance Optical System
The infinity colour-corrected optical system is supplied with super-widefield 10× eyepieces and five long-working-distance objectives. Together, these provide a standard optical magnification range of 50× to 1000×.
The 5×, 10× and 20× objectives use a Plan Semi-APO design, while the higher-magnification 50× and 100× objectives use a Plan APO design. All five standard objectives support reflected brightfield and darkfield observation.
| Objective | Optical design | Numerical aperture | Working distance |
|---|---|---|---|
| 5× | LWD Plan Semi-APO, BF/DF | 0.15 | 20mm |
| 10× | LWD Plan Semi-APO, BF/DF | 0.30 | 11mm |
| 20× | LWD Plan Semi-APO, BF/DF | 0.45 | 3mm |
| 50× | LWD Plan APO, BF/DF | 0.80 | 1mm |
| 100× | LWD Plan APO, BF/DF | 0.90 | 1mm |
Observation Techniques
Reflected Brightfield — Standard
Provides bright, evenly illuminated images for routine examination of opaque semiconductor, electronic and metallurgical samples.
Provides bright, evenly illuminated images for routine examination of opaque semiconductor, electronic and metallurgical samples.
Reflected Darkfield — Standard
Enhances edges, scratches and fine surface imperfections that may be difficult to distinguish using brightfield alone.
Enhances edges, scratches and fine surface imperfections that may be difficult to distinguish using brightfield alone.
Transmitted Brightfield — Standard on AUC-420B
Supports observation of suitable transparent and semi-transparent samples using the transmitted-light condenser.
Supports observation of suitable transparent and semi-transparent samples using the transmitted-light condenser.
Reflected DIC — Optional
Produces enhanced contrast and a relief-like appearance when examining small height variations and fine surface structures.
Produces enhanced contrast and a relief-like appearance when examining small height variations and fine surface structures.
Polarised Light — Optional
Suitable for examining birefringent materials, metallurgical structures, minerals, LCD components and semiconductor materials.
Suitable for examining birefringent materials, metallurgical structures, minerals, LCD components and semiconductor materials.
Typical Applications
Wafer inspection Large PCB inspection Semiconductor research Circuit packaging FPD inspection Materials science Precision moulds Precision castings Metalloceramics Electronic components
Technical Specification
| Available models | AUC-420A and AUC-420B |
|---|---|
| Optical system | Infinity colour-corrected optical system; 200mm tube length |
| Viewing head | Ergonomic trinocular head, adjustable from 0–35° |
| Interpupillary adjustment | 47–78mm |
| Light-path selection | Eyepieces/trinocular port: 100:0, 20:80 or 0:100 |
| Eyepieces | Super-widefield plan 10×/25mm eyepieces with dioptre adjustment |
| Standard objectives | 5×, 10× and 20× LWD Plan Semi-APO; 50× and 100× LWD Plan APO |
| Optical magnification | 50×–1000× with the standard eyepieces and objectives |
| Nosepiece | Motorised and coded backward-facing sextuple nosepiece with front-mounted objective-switching buttons and DIC slot |
| Reflected illumination | 24V/100W halogen Köhler illumination with six-position turret |
| Standard reflected modules | Two brightfield modules and one darkfield module |
| Transmitted illumination | Adjustable 40W LED system with fibre-optic light guide—standard on AUC-420B |
| Condenser | Long-working-distance condenser, NA 0.65—standard on AUC-420B |
| Focusing | Low-position coaxial coarse and fine focus; 1µm fine division; 35mm movement range |
| Stage | Three-layer mechanical stage with clutch; 356 × 305mm stage and movement range |
| Transmitted-light area | 356 × 284mm |
| Wafer capacity | Up to 12 inches using the supplied wafer holder |
| ECO function | Included with dedicated ECO control |
Standard Equipment
- Infinity colour-corrected optical system
- 0–35° tilting trinocular viewing head
- Pair of super-widefield 10×/25mm plan eyepieces
- 5×, 10× and 20× LWD Plan Semi-APO BF/DF objectives
- 50× and 100× LWD Plan APO BF/DF objectives
- Motorised and coded backward-facing sextuple nosepiece
- Front-mounted objective-switching controls
- DIC accessory slot within the nosepiece
- 100W halogen reflected Köhler illumination
- Two brightfield modules and one darkfield module
- 356 × 305mm mechanical stage with clutching handle
- Holder for wafers up to 12 inches
- Anti-static protective cover
- Dust cover and UK power cord
- Transmitted-light condenser and 40W LED system with the AUC-420B
Optional Accessories
- Reflected-light DIC kit for 10×, 20×, 50× and 100× objectives
- Reflected-light polariser and 0–360° rotatable analyser
- Transmitted-light polariser and analyser
- Alternative binocular and trinocular viewing heads
- Alternative eyepiece magnifications
- Alternative long-working-distance brightfield objectives
- Motorised X Y Stage
- Motorised Focus Drive
- LED reflected-light illuminator
- Neutral-density and colour-correction filters
- 0.5× C-mount camera adapter
- 1× C-mount camera adapter
- 0.01mm calibration slide
- Sample presser
- Microscope camera and imaging software
- Computer and display solutions
All optional accessories are available on a Price on Request basis.
Why Choose Auckland Scientific?
Auckland Scientific has extensive experience in professional microscopy, industrial inspection and digital imaging applications. We work with customers to understand their samples, inspection methods and reporting requirements before recommending a system.
We can help configure the correct microscope, illumination techniques, objectives, camera, software and display solution for your application.
Available services include:
- Pre-sales application advice
- System configuration and camera selection
- Installation and commissioning
- Operator training
- Preventative maintenance
- Technical and application support
Price on Application
The AUC-420 Series can be supplied on a quotation basis so that the microscope and optional imaging equipment can be configured for your application.
Contact Auckland Scientific for technical advice and a tailored quotation.
Images may show optional equipment or accessories. Computer, display, camera and imaging software are not included unless specified in the quotation. Specifications may be subject to technical revision. Three-year warranty conditions apply, and annual preventative servicing by Auckland Scientific is required to maintain extended warranty cover.