AUC-4050-NIR Near-Infrared Inspection Microscope
£64,995.00
Sale price
£64,995.00
Regular price
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AUC-4050-NIR Near-Infrared Inspection Microscope
£64,995.00
Sale price
£64,995.00
Regular price
NEAR-INFRARED INDUSTRIAL INSPECTION
AUC-4050-NIR Near-Infrared Inspection Microscope
Inspect silicon and germanium wafers, packaged chips and semiconductor structures using near-infrared imaging.
The AUC-4050-NIR is an industrial near-infrared microscope imaging system for non-destructive examination of wafer interiors and packaged components. Near-infrared illumination and objectives corrected across visible-to-NIR wavelengths enable imaging of structures that are difficult to assess with visible light alone.
Typical applications
Silicon and germanium wafer inspection, CSP/SIP package analysis, chip packaging investigation and semiconductor failure analysis.
Imaging and optical performance
- Dedicated monochrome NIR camera supplied as standard: 3.2 MP, 400–1100 nm sensitivity, USB 3.0, up to 120 fps at 2064 × 1544 pixels, 3.45 μm pixel size.
- Plan semi-apochromatic NIR objectives corrected from 450–1700 nm, with a 0–1.2 mm correction collar on the 20× and 50× objectives.
- Bright-field and NIR reflected modes, with an electrically controlled aperture diaphragm that automatically matches objective magnification.
- Motorised sextuple bright-field nosepiece with DIC slot and powered forward/reverse objective selection.
Standard specification
| Optical system | Infinity colour-corrected |
|---|---|
| Viewing head | 30° tilting NIR trinocular head; erect image; 50–76 mm interpupillary distance; 100:0 or 0:100 light split |
| Eyepieces | High-eyepoint wide-field plan PL10×/23 mm with adjustable dioptre |
| Objectives | 5× / NA 0.15 / WD 19.5 mm; 10× / NA 0.30 / WD 12.2 mm; 20× / NA 0.45 / WD 7.31–7.57 mm; 50× / NA 0.70 / WD 2.68–2.93 mm. All specified for 450–1700 nm. |
| Magnification | 50×–500× total magnification |
| Stage | 8-inch, three-layer mechanical stage; 525 × 330 mm; 210 × 210 mm travel; glass plate for reflected use |
| Focus and frame | Low-position coaxial focus; 35 mm coarse range; 0.001 mm fine precision; built-in 100–240 V wide-voltage system |
| NIR illumination | Bright-field NIR reflected illuminator with filter slot; 12 V / 100 W NIR halogen light box and lamp |
| Standard imaging system | 3.2 MP monochrome NIR camera, desktop PC with 23-inch monitor, MvImage-Industry software and dongle |
| Included filter | 1100 nm band-pass NIR filter |
Software and supplied accessories
MvImage-Industry supports real-time image capture, still photography and video, exposure and image adjustments, Z-stack and timed capture, measurement with scale annotation, data export, edge measurement and image enhancement. Supported electrical microscope functions can be controlled through the software. A 1× adjustable-focus C-mount adapter, objective micrometer, reticle, metallographic correction film, 0.01 mm stage micrometer and hexagonal spanners are included in the stated standard outfit.
Optional configuration
- 1.3 MP monochrome InGaAs camera with 400–1700 nm sensitivity.
- 1200 nm and 1300 nm band-pass NIR filters.
- Alternative eyepieces and stage configurations.
Optional items are not included unless specifically listed in the quotation.
Auckland Scientific 3-year warranty
Supplied with an Auckland Scientific 3-year warranty (conditions apply).
Need advice choosing the right configuration?
Call Auckland Scientific to discuss your sample, wafer size and inspection requirements. We can help you select the camera and wavelength configuration for your inspection task.