Delphi X Inverso Inverted Metallurgical Microscope with Brightfield, Darkfield & Polarised Light RESEARCH GRADE
Price available on request — please contact us for a quote
Euromex Delphi-X Inverso Advanced Materials Science Microscope
10 Years Warranty
The Euromex Delphi-X Inverso is a professional inverted microscope designed for demanding materials science and industrial inspection applications.
It supports brightfield, darkfield and polarised-light observation, with optional differential interference contrast. Its high-numerical-aperture, long-working-distance infinity-corrected objectives provide excellent resolution when examining opaque materials without cover glasses.
The large mechanical stage can support samples weighing up to 30 kg, making the microscope particularly suitable for examining large or heavy industrial components.
Key features
- Advanced inverted materials science microscope
- Brightfield, darkfield and polarised-light observation
- Optional differential interference contrast
- Trinocular viewing head
- Three available camera ports
- Built-in Bertrand lens
- Widefield 10×/22 mm eyepieces
- Long-working-distance infinity-corrected objectives
- Plan semi-apochromatic and plan apochromatic optics
- Sextuple objective nosepiece
- Integrated 1.5× magnification changer
- Six-position multifunctional contrast wheel
- Large mechanical stage supporting samples up to 30 kg
- Low-positioned focusing and stage controls
- Adjustable 100 W reflected-light halogen illumination
Viewing head
- Trinocular head with 45° inclined eyepiece tubes
- Interpupillary distance adjustable from 47 to 78 mm
- Built-in Bertrand lens
- Selectable light distribution:
| Head position | Light distribution |
|---|---|
| Visual | 100% visual / 0% camera |
| Simultaneous | 80% visual / 20% camera |
| Photography | 0% visual / 100% camera |
Eyepieces
- Pair of DIN high-widefield plan 10× eyepieces
- 22 mm field of view
Optional measuring, focusing, cross-line and grid eyepieces are available separately.
Objective nosepiece
- Sextuple revolving objective nosepiece
- Mounted on precision ball bearings
- Integrated slot for optional DIC prisms
- Capacity for the optional 100× objective
Supplied objectives
| Objective | Numerical aperture | Working distance | Optical type |
|---|---|---|---|
| 5× | 0.15 | 20 mm | LWD plan semi-apochromatic BD |
| 10× | 0.30 | 11 mm | LWD plan semi-apochromatic BD |
| 20× | 0.45 | 3.1 mm | LWD plan semi-apochromatic BD |
| 50× | 0.80 | 1 mm | LWD plan apochromatic BD |
BD objectives support both brightfield and darkfield observation.
Objective specifications
- Infinity-corrected IOS optical system
- 45 mm parfocal distance
- M26 mounting thread
- No cover-glass correction
- High numerical apertures
- Long working distances
- Anti-fungus treated
- Anti-reflection coated for maximum light transmission
Magnification
When used with the supplied 10× eyepieces:
- 50×
- 100×
- 200×
- 500×
Integrated 1.5× magnification changer
The built-in magnification changer increases the selected objective magnification by 1.5× without requiring the objective to be changed.
| Objective | Standard total magnification | With 1.5× changer |
|---|---|---|
| 5× | 50× | 75× |
| 10× | 100× | 150× |
| 20× | 200× | 300× |
| 50× | 500× | 750× |
Optional 100× objective
| Objective | Numerical aperture | Working distance | Optical type |
|---|---|---|---|
| 100× | 0.90 | 1 mm | LWD plan apochromatic BD |
The optional 100× objective provides:
- 1000× total magnification
- 1500× total magnification with the 1.5× changer
Stage
- Large 340 × 230 mm stage
- Coaxial 130 × 85 mm X-Y mechanical movement
- Maximum supported sample weight: 30 kg
- Low-positioned stage controls
Supplied stage inserts
- Metal insert with 20 mm aperture
- Metal insert with 28 mm aperture
- Metal insert with drop-shaped aperture
Six-position multifunctional wheel
The microscope incorporates a six-position multifunctional wheel supplied with:
- Two brightfield cubes
- One darkfield cube
- One polarisation-filter cube
- Prism slider for 5× to 20× objectives
- Prism slider for 50× and optional 100× objectives
- Analyser slider
This arrangement allows convenient switching between observation techniques.
Polarisation
The supplied polarisation equipment allows examination of anisotropic and birefringent materials.
The built-in Bertrand lens can be used for observing the back focal plane and interference figures where appropriate.
Optional differential interference contrast
Differential interference contrast can enhance subtle surface relief and variations in suitable specimens.
Available DIC options include:
- DIC configuration for the 5× to 20× objectives
- DIC prism for the 5× and 20× objectives
- DIC prism for the 50× and optional 100× objectives
- DIC analyser
The required DIC components should be selected according to the objectives and magnifications being used.
Additional filter slots
The illumination system includes:
- Field diaphragm
- Aperture diaphragm
- Two additional slider slots
- Slider containing two neutral-density filters
Focusing system
- Low-positioned coaxial coarse and fine focusing controls
- 10 mm focusing adjustment
- Fine-focus precision: 1 µm
- Adjustable focusing friction
Camera connections
The microscope offers three camera connection points:
- Standard trinocular photo port
- Left-side camera port
- Right-side camera port
This allows flexible integration of imaging and documentation systems.
Optional C-mount adapters include:
- 0.4× adapter for 1/3-inch cameras
- 0.5× adapter for 1/2-inch cameras
- 1× adapter for 1-inch and 2/3-inch cameras
Camera adapter selection should be matched to the camera sensor size.
Illumination
- Reflected-light illumination
- 100 W halogen lamp
- Adjustable light intensity
- Internal 100-240 V power supply
Optional accessories
- 100×/0.90 LWD plan apochromatic objective
- Differential interference contrast components
- Additional widefield eyepieces
- Focusing eyepieces
- Cross-line eyepieces
- Measuring eyepieces
- Grid-reticle eyepieces
- Alternative magnification eyepieces
- Camera adapters for different sensor sizes
- Compatible microscope cameras
Typical applications
- Advanced metallurgical inspection
- Materials science
- Metal and alloy examination
- Surface-defect analysis
- Failure analysis
- Coating inspection
- Polymer and composite examination
- Semiconductor and electronics inspection
- Automotive and aerospace materials
- Precision engineering
- Quality assurance
- Manufacturing inspection
- Research and industrial laboratories
- Digital image capture and documentation
Optional objectives, DIC components, eyepieces, camera adapters and imaging equipment are available separately.
Model: EDI-2053-PLMi
Source: official Euromex Delphi-X Inverso specifications
Please contact Auckland Scientific for help configuring the microscope for your samples and required observation methods.