Upright Material Microscope with Reflected Light, Brightfield, Halogen illumination

Upright Materials Science Microscope

A robust upright materials science microscope designed for reflected-light examination of opaque samples. Its powerful incident illuminator incorporates field and aperture iris diaphragms, allowing the illumination to be optimised across the available magnification range.

The microscope is supplied with plan achromatic objectives offering generous working distances for metallurgical inspection, materials analysis and industrial quality-control applications.

Key features

• Upright materials science microscope
• Reflected brightfield illumination
• Binocular viewing head with photo tube
• Widefield 10× eyepieces with FN22 field of view
• One eyepiece fitted with a cross-line and scale graticule
• Quintuple objective nosepiece
• Mechanical stage
• Field iris diaphragm
• Aperture iris diaphragm
• Regulated illumination power supply
• 12 V, 50 W halogen incident illumination
• Polariser and analyser

Supplied objectives

Total magnification

When used with the supplied 10× eyepieces:

• 50×
• 100×
• 200×
• 500×

Optional objectives

Optional accessories

• 0.5× C-mount camera adapter
• Reflecting stage micrometer with a 1 mm scale divided into 100 parts
• Compatible microscope camera systems

Typical applications

• Metallurgical inspection
• Materials science
• Examination of polished metal samples
• Surface inspection
• Weld and fracture examination
• Failure analysis
• Manufacturing quality control
• Engineering laboratories
• Research and education

Optional objectives, camera equipment and calibration accessories are available separately.

Please contact Auckland Scientific for configuration and compatibility advice.