Fully Motorised Wafer Inspection Microscope for upto 8" / 200mm Wafers
£39,995.00
Sale price
£39,995.00
Regular price
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Fully Motorised Wafer Inspection Microscope for upto 8" / 200mm Wafers
£39,995.00
Sale price
£39,995.00
Regular price
Advanced Automated Industrial Microscopy
Auckland Scientific AUC-425
Fully Motorised Metallurgical Inspection Microscope
A highly motorised trinocular inspection microscope developed for efficient examination of sensors, wafers, LCD displays, semiconductors, electronic components and other large-area industrial samples.
Three-Year Warranty
Supplied with an Auckland Scientific three-year warranty. Conditions apply, including annual preventative servicing by Auckland Scientific.
Automated Inspection of Large Industrial Samples
The AUC-425 combines a motorised 200 × 200mm XY stage, motorised focusing, motorised objective selection and electronically controlled illumination functions within a stable industrial microscope platform.
Its extensive automation allows the operator to move across large samples, adjust focus, change objectives and select observation settings using the integrated front controls. This reduces repetitive manual adjustment and supports more efficient routine inspection.
The microscope is suitable for samples ranging from small sensors and electronic components to large wafers and complete LCD display panels.
Highly Motorised Control
The AUC-425 provides motorised or electronically controlled operation of:
- XY stage movement
- Coarse and fine focusing
- Objective selection
- Observation-mode selection
- Illumination brightness adjustment
- Aperture adjustment
Features & Benefits
Motorised 200 × 200mm stage
The large motorised XY stage allows efficient movement and positioning across wafers, display panels and other large-area samples.
The large motorised XY stage allows efficient movement and positioning across wafers, display panels and other large-area samples.
Motorised focusing
Motorised Z-axis control provides a fine focusing precision of 0.8µm across a 35mm focusing range.
Motorised Z-axis control provides a fine focusing precision of 0.8µm across a 35mm focusing range.
Motorised sextuple nosepiece
Electronic objective selection allows efficient switching between magnifications without manually rotating the nosepiece.
Electronic objective selection allows efficient switching between magnifications without manually rotating the nosepiece.
Sample protection
A programmable Z-axis upper limit helps reduce the risk of contact between the objectives and valuable samples.
A programmable Z-axis upper limit helps reduce the risk of contact between the objectives and valuable samples.
Z-axis reset
The Z-axis reset function supports safer and more convenient sample changing.
The Z-axis reset function supports safer and more convenient sample changing.
Brightness memory
Illumination brightness can be recalled for each objective and adjusted automatically when the magnification is changed.
Illumination brightness can be recalled for each objective and adjusted automatically when the magnification is changed.
22mm field of view
The widefield 10×/22mm eyepieces provide a broad observation area for faster sample navigation.
The widefield 10×/22mm eyepieces provide a broad observation area for faster sample navigation.
Semi-apochromatic objectives
Long-working-distance brightfield and darkfield objectives support detailed imaging of uneven industrial samples.
Long-working-distance brightfield and darkfield objectives support detailed imaging of uneven industrial samples.
Reflected and transmitted LED illumination
Independent 5W LED systems provide stable colour temperature, reduced energy consumption and long operating life.
Independent 5W LED systems provide stable colour temperature, reduced energy consumption and long operating life.
Integrated front controls
Frequently used controls are located close to the operator for convenient adjustment during inspection.
Frequently used controls are located close to the operator for convenient adjustment during inspection.
Erect-image viewing
Stage movement and the direction seen through the eyepieces correspond naturally, supporting intuitive sample navigation.
Stage movement and the direction seen through the eyepieces correspond naturally, supporting intuitive sample navigation.
Open SDK available
An optional software development kit supports integration and development of customised imaging or inspection workflows.
An optional software development kit supports integration and development of customised imaging or inspection workflows.
Long-Working-Distance Industrial Optics
The standard configuration includes four infinity-corrected Semi-Apochromatic metallurgical objectives for reflected brightfield and darkfield observation.
With the supplied 10× eyepieces, the standard objectives provide a total optical magnification range of 50× to 500×. An optional 100× objective extends the available magnification to 1000×.
| Objective | Numerical aperture | Working distance | Supply status |
|---|---|---|---|
| 5× BF/DF | 0.15 | 20mm | Standard |
| 10× BF/DF | 0.30 | 11mm | Standard |
| 20× BF/DF | 0.40 | 12mm | Standard |
| 50× BF/DF | 0.50 | 10.6mm | Standard |
| 100× BF/DF | 0.80 | 3.5mm | Optional |
Multiple Observation Techniques
Reflected Brightfield — Standard
Provides evenly illuminated, true-colour imaging for routine examination of opaque semiconductor, electronic and metallurgical samples.
Provides evenly illuminated, true-colour imaging for routine examination of opaque semiconductor, electronic and metallurgical samples.
Reflected Darkfield — Standard
Enhances fine scratches, edges and surface imperfections that may be difficult to identify using brightfield illumination alone.
Enhances fine scratches, edges and surface imperfections that may be difficult to identify using brightfield illumination alone.
Reflected Polarised Light — Standard
The supplied polariser and analyser module supports the examination of birefringent materials, metallurgical structures, LCD components and semiconductor materials.
The supplied polariser and analyser module supports the examination of birefringent materials, metallurgical structures, LCD components and semiconductor materials.
Transmitted Brightfield — Standard
The transmitted LED illumination and condenser support suitable transparent and semi-transparent samples, including optical components and flat-panel display materials.
The transmitted LED illumination and condenser support suitable transparent and semi-transparent samples, including optical components and flat-panel display materials.
Reflected DIC — Configurable
Differential interference contrast can enhance small height differences and fine surface structures when the system is configured with the appropriate modules.
Differential interference contrast can enhance small height differences and fine surface structures when the system is configured with the appropriate modules.
Typical Applications
Wafer inspection LCD display inspection Semiconductors Electronic sensors PCB inspection Precision moulds Metallurgical analysis Materials science Surface-defect inspection Optical components
Technical Specification
| Auckland Scientific model | AUC-425 |
|---|---|
| Optical system | Infinity colour-corrected optical system |
| Viewing head | Adjustable erect-image trinocular head, 0–30° inclination |
| Interpupillary distance | 47–78mm |
| Light-path split | Eyepieces/trinocular port: 100:0 or 0:100 |
| Eyepieces | Widefield 10×/22mm, dioptre adjustable |
| Standard objectives | 5×, 10×, 20× and 50× infinity Semi-Apochromatic BF/DF metallurgical objectives |
| Standard magnification | 50×–500× |
| Nosepiece | Motorised sextuple objective nosepiece |
| Stage | Three-layer motorised stage; 200 × 200mm movement range |
| Focusing system | Motorised coaxial coarse and fine focus; 0.8µm fine precision; 35mm travel |
| Focus protection | Z-axis reset and programmable upper-limit functions |
| Reflected illumination | Motorised 5W LED Köhler illumination |
| Transmitted illumination | 5W LED Köhler illumination |
| Standard modules | Brightfield, darkfield, polariser and analyser |
| Condenser | NA 0.65/0.1 condenser with aperture diaphragm |
| Camera connection | 1× C-mount adapter included |
Standard Equipment
- Infinity colour-corrected optical system
- Adjustable erect-image trinocular viewing head
- Pair of widefield 10×/22mm eyepieces
- 5×, 10×, 20× and 50× Semi-Apochromatic BF/DF objectives
- Motorised sextuple objective nosepiece
- Three-layer motorised XY stage with 200 × 200mm movement range
- Motorised focusing system with Z-axis reset and upper limit
- 5W LED reflected Köhler illuminator
- 5W LED transmitted Köhler illuminator
- Brightfield and darkfield observation modules
- Polariser and analyser module
- NA 0.65/0.1 condenser with aperture diaphragm
- 1× C-mount camera adapter
- UK power cord
Optional Accessories & System Enhancements
- 100× Semi-Apochromatic BF/DF objective
- Specialised long-working-distance objectives
- Reflected DIC configuration
- Blue, green and yellow filters
- Ground-glass filter
- 0.5× C-mount adapter
- 0.7× C-mount adapter
- Microscope camera
- Computer and display system
- Metallurgical imaging and analysis software
- Open software development kit for secondary integration
All optional accessories and system enhancements are available on a Price on Request basis.
Digital Imaging & Analysis
The supplied 1× C-mount adapter allows a compatible microscope camera to be added. Camera, computer and software options can be configured according to the required field of view, resolution, measurement accuracy and reporting workflow.
Available imaging and metallurgical analysis functions can include:
- Live image capture and recording
- Real-time and static measurement
- Image stitching
- Extended depth-of-field imaging
- Real-time HDR imaging
- Annotation and reporting
Imaging equipment notice: A microscope camera, computer, display and imaging software are not included in the standard microscope configuration unless expressly stated in your quotation.
Why Choose Auckland Scientific?
Auckland Scientific has extensive experience in professional microscopy, industrial inspection and digital imaging applications. We work with customers to understand their samples, observation techniques, automation needs and reporting requirements before recommending a system.
We can help configure the correct microscope, objectives, contrast techniques, camera, software and display solution for your application.
Available services include:
- Pre-sales application advice
- System configuration and camera selection
- Installation and commissioning
- Operator training
- Preventative maintenance
- Technical and application support
Price on Application
The AUC-425 can be supplied on a quotation basis so that its objectives, imaging equipment, software and integration options can be configured for your inspection requirements.
Contact Auckland Scientific for technical advice and a tailored quotation.
Images may show optional equipment or accessories. Camera, computer, display and imaging software are not included unless specified in the quotation. Specifications may be subject to technical revision. Three-year warranty conditions apply, and annual preventative servicing by Auckland Scientific is required to maintain extended warranty cover.