Inverted Metallurgical Microscope with Brightfield or Brightfield / Darkfield Options
Inverted Metallurgical Microscope with Brightfield or Brightfield / Darkfield Options
The Inverted Brightfield Materials Microscope
A robust inverted materials microscope designed for brightfield inspection of polished metal samples and other opaque materials. Its inverted configuration enables larger and heavier specimens to be examined while providing generous working distances.
Key features
- Inverted microscope configuration
- Brightfield reflected-light observation
- Binocular viewing head
- Widefield 10× eyepieces
- Quintuple objective nosepiece
- Mechanical stage
- 6 V, 30 W halogen illumination
- Four plan achromatic objectives supplied
Supplied objectives
| Objective | Numerical aperture | Working distance |
|---|---|---|
| Plan achromatic 5× | 0.12 | 26.10 mm |
| Plan achromatic 10× | 0.25 | 20.20 mm |
| Plan achromatic 20× | 0.40 | 8.80 mm |
| Plan achromatic 50× | 0.70 | 3.68 mm |
Magnification
When used with the supplied 10× eyepieces, the microscope provides the following total magnifications:
- 50×
- 100×
- 200×
- 500×
Optional objectives
Additional brightfield plan achromatic objectives are available:
| Objective | Numerical aperture | Working distance |
|---|---|---|
| 40× | 0.60 | 3.98 mm |
| 60× | 0.70 | 0.22 mm |
| 80× | 0.80 | 1.28 mm |
| 100× | 0.85 | 0.40 mm |
Optional camera adapters
- 0.5× C-mount adapter
- 1.0× C-mount adapter
Typical applications
- Metallurgical inspection
- Materials science
- Examination of polished metal samples
- Weld and surface inspection
- Quality control
- Manufacturing and engineering laboratories
- Research and education
Camera equipment and optional objectives are available separately.
Please contact Auckland Scientific for configuration and compatibility advice.
Inverted Brightfield and Darkfield Materials Microscope
A robust inverted materials microscope offering both brightfield and darkfield reflected-light observation. Darkfield illumination enhances edges, scratches and fine surface features that may be difficult to distinguish under conventional brightfield illumination.
Its inverted configuration is particularly suitable for examining larger, heavier or irregularly shaped opaque samples.
Key features
- Inverted microscope configuration
- Brightfield and darkfield reflected-light observation
- Binocular viewing head
- Widefield 10× eyepieces
- Quintuple objective nosepiece
- Mechanical stage
- 12 V, 50 W halogen illumination
- Four brightfield/darkfield plan achromatic objectives supplied
Supplied objectives
| Objective | Numerical aperture | Working distance |
|---|---|---|
| Plan achromatic BD 5× | 0.12 | 9.70 mm |
| Plan achromatic BD 10× | 0.25 | 9.30 mm |
| Plan achromatic BD 20× | 0.40 | 7.23 mm |
| Plan achromatic BD 50× | 0.70 | 2.50 mm |
Magnification
When used with the supplied 10× eyepieces, the microscope provides the following total magnifications:
- 50×
- 100×
- 200×
- 500×
Optional brightfield/darkfield objectives
| Objective | Numerical aperture | Working distance |
|---|---|---|
| Plan achromatic BD 40× | 0.60 | 3.00 mm |
| Plan achromatic BD 60× | 0.70 | 1.90 mm |
| Plan achromatic BD 80× | 0.80 | 0.80 mm |
| Plan achromatic BD 100× | 0.85 | 0.22 mm |
Optional camera adapters
- 0.5× C-mount adapter
- 1.0× C-mount adapter
Typical applications
- Metallurgical inspection
- Materials science
- Surface-defect detection
- Examination of scratches, edges and inclusions
- Weld and fracture analysis
- Quality assurance and failure investigation
- Manufacturing and engineering laboratories
- Research and education
Camera equipment and optional objectives are available separately.
Please contact Auckland Scientific for configuration and compatibility advice.