The AUC-MET 24 series of upright metallurgical microscopes have been developed for research with a number of pioneering designs in appearance and functions, with wide field of view, high definition and bright/dark field semi-apochromatic & plan apochromatic metallurgical objectives and an ergonomical operating system.

Supplied with:

Ergo Tilting Trinocular Head, adjustable 0-35° inclined, interpupillary distance 47mm-78mm; splitting ratio Eyepiece: Trinocular=100:0 or 20:80 or 0:100

Super wide field plan eyepiece SW10X/25mm, diopter adjustable

NIS45 Infinite LWD Plan Semi-APO Objective (BF & DF):

• 5X/NA=0.15, WD=20mm
• 10X/NA=0.3, WD=11mm
• 20X/NA=0.45, WD=3.0mm

NIS45 Infinite LWD Plan APO Objective (BF & DF):

• 50X/NA=0.8, WD=1.0mm
• 100X/NA=0.9, WD=1.0mm

Sextuple Nosepiece (with DIC slot) - 6 Objective Ports allows for an additional objective.

Transmitted light option supplied with 24V/100W halogen lamp, Kohler illumination, with ND6/ND25 filters

Reflected light 24W/100W halogen lamp, with 6 position turret (allows for  additional filters e.g fluorescent filter cubes. built in ND6/ ND25filters. 

Stage with travel range 105mmX105mm (Right or left handle); precision: 1mm; with hard oxidized surface to prevent abrasion, Y direction could be locked.

Dust Cover

1.Excellent Infinite Optical System.

With the high performance infinite optical system, the AUC-MET-24 series upright metallurgical microscope provides high resolution, high definition and chromatic aberration corrected images.

Designed with modularity to meet various industrial and material science applications. It gives users flexibility to build a system for specific needs.

3.ECO Function.

The microscope light will switch off automatically after 15 minutes if not in use. It not only saves energy, but also increases the lamp lifetime.

4. Comfortable and Easy to Use.

(1) NIS45 Infinite Plan Semi-APO and APO Objectives.

With high performance grade glass and advanced coating technology, NIS45 objective lens can provide high resolution images and accurately reproduce the natural color of the samples. For special applications, a variety of objectives are available, including polarizing and long working distance.

(2) Nomarski DIC.

With the newly designed DIC module provides an ultra sharp image to show true relief  and undulation on the surface of the sample, It is ideal for the observation of LCD conducting particles and the surface scratches of hard-disks etc.

(3) Focusing System.

In order to make the system suitable for the operating habits of the operators, the knob of focusing and stage can be adjusted to the left-hand side or right-hand side. This design makes the operation more comfortable for left handed or right handed operators..

(4) Ergo Tilting Trinocular Head.

Eyepiece tube can be adjustable from 0 ° to 35 °，Trinocular tube can be connected to DSLR camera and digital camera, having a 3-postion beam splitter (0:100, 100:0, 80:20), the splitter bar can be assembled on the left or right side according to the user’s requirement.

5.Various Observation Methods

(1)Darkfield (Wafer)

Darkfield enables the observation of scattered or diffracted light from the sample. Anything that is not flat reflects this light while anything that is flat appears dark so imperfections clearly stand out. The user can identify the existence of even a minute scratch or flaw down to the 8nm level-smaller than the resolving power limit of an optical microscope. Darkfield is ideal for detecting minute scratches or flaws on a sample and examining mirror surface samples, particularly wafers.

(2)Transmitted Light Observation (LCD)

For transparent samples such as LCDs, plastics, and glass materials, transmitted light observation is available by using a variety of condensers. Examining samples in transmitted brightfield and polarized light can be accomplished all in one convenient system.

(3)Polarised Light

This microscopic observation technique utilizes polarised light generated by a set of filters (analyzer and polarizer). The characteristics of the sample directly affect the intensity of the light reflected through the system. It is suitable for metallurgical structures (i.e., growth pattern of graphite on nodular casting iron), minerals, LCDs and semiconductor materials.

The AUC-MET-24 series microscopes are widely used in institutes and laboratories to observe and identify the structure of various metals and alloys, electronics, chemicals, materials and the semiconductor industry, such as wafers, ceramics, integrated circuits, electronic chips, printed circuit boards, LCD panels, films, powders, toners, wires, fibers, plated coatings, glass, paint, plastics & other non-metallic materials etc

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